World Class Solutions for Inertial MEMS Handling, Stimulus and Test

The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.

As MEMS device complexity and manufacturing volumes increase, so do the pressures to reduce production costs and unit sales price. ULTRA series test cells provide maximum flexibility and performance along with a significant reduction in Cost of Ownership (COO) and Cost of Test (COT).

The ULTRA L is a “Lab” or engineering unit that allows test development, device characterization, or failure analysis in an economical configuration and footprint.